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Pieter Jan M. Stallen

Pieter Jan M. Stallen

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Environmental Impact Assessment, Technology Assessment, and Risk Analysis37 %
Environmental Impact Assessment, Technology Assessment, and Risk Analysis
By: Pieter Jan M. Stallen, Jeryl L. Mumpower, Vincent T. Covello, V.R.R. Uppuluri
Publisher: Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
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₹23,355
₹14,714
Binding:
Paperback
Release:
24 Nov 2011
Language:
English
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