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Patrick M. Lenahan

Patrick M. Lenahan

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Materials Reliability in Microelectronics VI: Volume 428NR
Materials Reliability in Microelectronics VI: Volume 428
By: Anthony S. Oates, William F. Filter, J. Joseph Clement, Patrick M. Lenahan, Robert Rosenberg
Publisher: Materials Research Society
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₹2,251
Binding:
Hardback
Release:
18 Nov 1996
Language:
English
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