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1.
VLSI Test Principles and Architectures45 %
VLSI Test Principles and Architectures
By: Charles Stroud, Benoit Nadeau-Dostie, Abhijit Chatterjee, Laung-Terng Wang, Cheng-Wen Wu
Publisher: Elsevier Science & Technology
No Review Yet
₹8,172
₹4,495
Binding:
Hardback
Release:
14 Aug 2006
Language:
English
Available
Ships within 12-14 Days Explain..
2.
System-on-Chip Test Architectures45 %
System-on-Chip Test Architectures
By: Laung-Terng Wang, Charles E. Stroud, Nur A. Touba
Publisher: Elsevier Science & Technology
No Review Yet
₹7,718
₹4,245
Binding:
Hardback
Release:
08 Jan 2008
Language:
English
Available
Ships within 12-14 Days Explain..
3.
Electronic Design Automation45 %
Electronic Design Automation
By: Laung-Terng Wang, Yao-Wen Chang, Kwang-Ting (Tim) Cheng
Publisher: Elsevier Science & Technology
No Review Yet
₹9,994
₹5,497
Binding:
Hardback
Release:
26 Mar 2009
Language:
English
Available
Ships within 12-14 Days Explain..
4.
VLSI Test Principles and Architectures3 % NR
VLSI Test Principles and Architectures
By: Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen
Publisher: Morgan Kaufmann Publishers
No Review Yet
₹2,748
₹2,666
Binding:
Digital (delivered electronically)
Release:
14 May 2014
Language:
English
International Edition
Ships within 10-12 Days Explain..
Free Shipping in India and low cost Worldwide.
5.
System-On-Chip Test Architectures24 % NR
System-On-Chip Test Architectures
By: Charles Stroud, Laung-Terng Wang, Nur A Touba
Publisher: Morgan Kaufmann Publishers
No Review Yet
₹4,272
₹3,247
Binding:
Digital (delivered electronically)
Release:
14 May 2014
Language:
English
International Edition
Ships within 12-14 Days Explain..
Free Shipping in India and low cost Worldwide.
6.
VLSI Test Principles and ArchitecturesNR
VLSI Test Principles and Architectures
By: Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen
Publisher: Morgan Kaufmann Publishers
No Review Yet
₹7,688
Binding:
Paperback
Release:
21 Jul 2006
Language:
English
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