Humburger Icon
Logo1
Login & Sign up
Bookswagon-24x7 online bookstore
AddBanner
Home icon Home
Account Icon Account
Wishlist Icon Wishlist
Cart Icon Cart
Bookswagon icon Categories
Close

Refine your Search

By Price

Availability

Shipping Time

Source

Binding

Language

Publication Year

Filter By Category
John V. Gilfrich

John V. Gilfrich

11 results found
List viewGrid view
Sort By:
1.
Advances in X-ray Analysis37 %
Advances in X-ray Analysis
By: John V. Gilfrich, etc.
Publisher: Kluwer Academic Publishers Group
No Review Yet
₹8,488
₹5,347
Binding:
Hardback
Release:
/10/1993
Language:
English
Available
Ships within 12-14 Days Explain..
2.
Advances in X-Ray Analysis36 %
Advances in X-Ray Analysis
By: John V. Gilfrich, Ting C. Huang, Ron Jenkins, I. Cev Noyan, C.C. Goldsmith
Publisher: Springer-Verlag New York Inc.
No Review Yet
₹5,307
₹3,396
Binding:
Paperback
Release:
05 Nov 2012
Language:
English
Available
Ships within 12-14 Days Explain..
3.
Advances in X-Ray Analysis36 %
Advances in X-Ray Analysis
By: John V. Gilfrich, Ting C. Huang, Charles S. Barrett, Ron Jenkins
Publisher: Springer-Verlag New York Inc.
No Review Yet
₹5,307
₹3,396
Binding:
Paperback
Release:
02 Jun 2012
Language:
English
Available
Ships within 12-14 Days Explain..
4.
Advances in X-Ray Analysis54 %
Advances in X-Ray Analysis
By: Deane K. Smith, John V. Gilfrich, Ting C. Huang, Paul K. Predecki, Charles S. Barrett
Publisher: Springer Science+Business Media
No Review Yet
₹8,488
₹3,904
Binding:
Hardback
Release:
01 Oct 1992
Language:
English
Available
Ships within 2-4 Days Explain..
5.
Advances in X-Ray Analysis37 %
Advances in X-Ray Analysis
By: Deane K. Smith, John V. Gilfrich, Ting C. Huang, Paul K. Predecki, D.K. Bowen
Publisher: Springer Science+Business Media
No Review Yet
₹31,847
₹20,064
Binding:
Hardback
Release:
30 Sep 1995
Language:
English
Available
Ships within 12-14 Days Explain..
6.
Advances in X-Ray Analysis
Advances in X-Ray Analysis
By: Deane K. Smith, John V. Gilfrich, Ting C. Huang, Paul K. Predecki, Ron Jenkins
Publisher: Springer Science+Business Media
No Review Yet
₹4,382
Binding:
Hardback
Release:
31 Jan 1998
Language:
English
Available
Ships within 1-2 Days Explain..
7.
Advances in X-Ray Analysis36 %
Advances in X-Ray Analysis
By: Deane K. Smith, John V. Gilfrich, Ting C. Huang, M.R. James, Ron Jenkins
Publisher: Springer-Verlag New York Inc.
No Review Yet
₹5,307
₹3,396
Binding:
Paperback
Release:
24 Oct 2012
Language:
English
Available
Ships within 12-14 Days Explain..
8.
Advances in X-Ray Analysis36 %
Advances in X-Ray Analysis
By: Deane K. Smith, John V. Gilfrich, Ting C. Huang, Paul K. Predecki, Ron Jenkins
Publisher: Springer-Verlag New York Inc.
No Review Yet
₹5,307
₹3,396
Binding:
Paperback
Release:
21 Nov 2012
Language:
English
Available
Ships within 12-14 Days Explain..
9.
Advances in X-Ray Analysis37 %
Advances in X-Ray Analysis
By: Paul K. Predecki, Charles S. Barrett, Ron Jenkins, John C. Russ , J.V. Gilfrich
Publisher: Springer Science+Business Media
No Review Yet
₹21,231
₹13,376
Binding:
Hardback
Release:
01 Jun 1989
Language:
English
Available
Ships within 12-14 Days Explain..
10.
Advances in X-Ray Analysis37 %
Advances in X-Ray Analysis
By: Paul K. Predecki, Charles S. Barrett, Ron Jenkins, John C. Russ , J.V. Gilfrich
Publisher: Springer-Verlag New York Inc.
No Review Yet
₹21,231
₹13,376
Binding:
Paperback
Release:
18 Jun 2013
Language:
English
Available
Ships within 12-14 Days Explain..
11.
Advances in X-Ray Analysis14 % NR
Advances in X-Ray Analysis
By: John V. Gilfrich, Ting C. Huang, Charles S. Barrett, Ron Jenkins
Publisher: Springer Science+Business Media
No Review Yet
₹6,840
₹5,899
Binding:
Hardback
Release:
01 Jun 1990
Language:
English
Out of Stock
Notify me when this book is in stockNotify Me
No more records found
ASK VIDYA