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1.

VLSI Test Principles and Architectures

45 %

VLSI Test Principles and Architectures

By: Charles Stroud, Benoit Nadeau-Dostie, Abhijit Chatterjee, Laung-Terng Wang, Cheng-Wen Wu

Publisher: Elsevier Science & Technology

No Review Yet

₹8,172

₹4,495

Binding:	Hardback
Release:	14 Aug 2006
Language:	English

Available

Ships within 12-14 Days Explain..

2.

Design for AT-Speed Test, Diagnosis and Measurement

59 %

Design for AT-Speed Test, Diagnosis and Measurement

By: Benoit Nadeau-Dostie

Publisher: Springer

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₹18,047

₹7,399

Binding:	Hardback
Release:	30 Sep 1999
Language:	English

Available

Ships within 1-2 Days Explain..

3.

Design for AT-Speed Test, Diagnosis and Measurement

37 %

Design for AT-Speed Test, Diagnosis and Measurement

By: Benoit Nadeau-Dostie

Publisher: Springer-Verlag New York Inc.

No Review Yet

₹15,923

₹10,031

Binding:	Paperback
Release:	26 Apr 2013
Language:	English

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Ships within 12-14 Days Explain..

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