Anand Krishna Asundi

Anand Krishna Asundi

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1.
Advances in Metrology for X-Ray and EUV Optics VIINR
Publisher: Spie Press
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₹7,089
Binding:
Paperback
Release:
30 Oct 2017
Language:
English
Out of Stock
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2.
Optical Micro- And NanometrologyNR
Publisher: Spie Press
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₹10,173
Binding:
Paperback
Release:
30 Jun 2016
Language:
English
Out of Stock
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3.
Advances in Metrology for X-Ray and EUV Optics VINR
Publisher: Spie Press
No Review Yet
₹6,127
Binding:
Paperback
Release:
28 Feb 2017
Language:
English
Out of Stock
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